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Daniel A. Kunz, Patrick Feicht, Sebastian Gödrich, Herbert Thurn, Georg Papastavrou, Andreas Fery and Josef Breu Space-Resolved In-Plane Moduli of Graphene Oxide and Chemically Derived Graphene Applying a Simple Wrinkling Procedure Advanced Materials 25

Version of Record online: 13 DEC 2012 | DOI: 10.1002/adma.201204049

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Mapping the in-plane moduli: A simple wrinkling process on a deformable substrate requiring only readily available topographical atomic force microscopy (AFM) imaging allows space-resolved determination of the mechanical properties of single graphene oxide and chemically derived graphene sheets. The lateral resolution in the sub-micrometer range delivers unique insights into the defect distribution within the nanoplatelets.

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