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Srikanth Ravipati, Jiann Shieh, Fu-Hsiang Ko, Chen-Chieh Yu and Hsuen-Li Chen Ultralow Reflection from a-Si Nanograss/Si Nanofrustum Double Layers Advanced Materials 25

Article first published online: 5 FEB 2013 | DOI: 10.1002/adma.201204235

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A double-layer nanostructure comprising amorphous Si nanograss on top of Si nanofrustums (NFs) with a total height of 680 nm exhibits ultralow reflection. Almost near-unity absorption and near-zero reflectance result in this layered nanostructure, over a broad range of wavelengths and a wide range of angles of incidence, due to the low packing density of a-Si and the smooth transition of the refractive index from the air to the Si substrate across both the nanograss and NF layers.

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