E-mail

E-mail a Wiley Online Library Link

Christian Melzer, Christopher Siol and Heinz von Seggern Transit Phenomena in Organic Field-Effect Transistors Through Kelvin-Probe Force Microscopy Advanced Materials 25

Article first published online: 29 APR 2013 | DOI: 10.1002/adma.201300004

Thumbnail image of graphical abstract

The temporal evolution of the surface-potential distribution in the channel of pentacene based field-effect transistors is investigated during the charge reversal from the electron to the hole dominated operation. This measurement allows the determination of the carrier density and electric field dependent hole mobility in the sub-threshold regime of the transistor.

Complete the form below and we will send an e-mail message containing a link to the selected article on your behalf

Required = Required Field

SEARCH