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M. Huijben, P. Yu, L. W. Martin, H. J. A. Molegraaf, Y.-H. Chu, M. B. Holcomb, N. Balke, G. Rijnders and R. Ramesh Ultrathin Limit of Exchange Bias Coupling at Oxide Multiferroic/Ferromagnetic Interfaces Advanced Materials 25

Version of Record online: 12 JUL 2013 | DOI: 10.1002/adma.201300940

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Exchange bias coupling at the multiferroic- ferromagnetic interface in BiFeO3/La0.7Sr0.3MnO3 heterostructures exhibits a critical thickness for ultrathin BiFeO3 layers of 5 unit cells (2 nm). Linear dichroism measurements demonstrate the dependence on the BiFeO3 layer thickness with a strong reduction for ultrathin layers, indicating diminished antiferromagnetic ordering that prevents interfacial exchange bias coupling.

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