E-mail a Wiley Online Library Link

Christian Westermeier, Matthias Fiebig and Bert Nickel Mapping of Trap Densities and Hotspots in Pentacene Thin-Film Transistors by Frequency-Resolved Scanning Photoresponse Microscopy Advanced Materials 25

Version of Record online: 25 JUN 2013 | DOI: 10.1002/adma.201300958

Thumbnail image of graphical abstract

Frequency-resolved scanning photoresponse microscopy of pentacene thin-film transistors is reported. The photoresponse pattern maps the in-plane distribution of trap states which is superimposed by the level of trap filling adjusted by the gate voltage of the transistor. Local hotspots in the photoresponse map thus indicate areas of high trap densities within the pentacene thin film.

Complete the form below and we will send an e-mail message containing a link to the selected article on your behalf

Required = Required Field