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Anna Marzegalli, Fabio Isa, Heiko Groiss, Elisabeth Müller, Claudiu V. Falub, Alfonso G. Taboada, Philippe Niedermann, Giovanni Isella, Friedrich Schäffler, Francesco Montalenti, Hans von Känel and Leo Miglio Unexpected Dominance of Vertical Dislocations in High-Misfit Ge/Si(001) Films and Their Elimination by Deep Substrate Patterning (Adv. Mater. 32/2013) Advanced Materials 25

Version of Record online: 19 AUG 2013 | DOI: 10.1002/adma.201370204

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An innovative strategy in dislocation analysis is described by Anna Marzegalli et al. on page 4408 demonstrating that vertical dislocations dominate in thick Ge layers on silicon substrates.

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