E-mail a Wiley Online Library Link

S. Joe Qin and Yingying Zheng Quality-relevant and process-relevant fault monitoring with concurrent projection to latent structures AIChE Journal 59

Version of Record online: 20 DEC 2012 | DOI: 10.1002/aic.13959

Complete the form below and we will send an e-mail message containing a link to the selected article on your behalf

Required = Required Field