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S. N. Terekhov, P. Mojzes, S. M. Kachan, N. I. Mukhurov, S. P. Zhvavyi, A. Yu. Panarin, I. A. Khodasevich, V. A. Orlovich, A. Thorel, F. Grillon and P.-Y. Turpin A comparative study of surface-enhanced Raman scattering from silver-coated anodic aluminum oxide and porous silicon Journal of Raman Spectroscopy 42

Article first published online: 20 APR 2010 | DOI: 10.1002/jrs.2661

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Three types of Ag-coated porous anodic aluminum oxide films and silvered porous silicon were prepared and characterized as SERS substrates. At 532 nm excitation, the SERS signals from AAO-based substrates were comparable with that from PSi-based ones, whereas at 441.6 nm they were about twice higher. It is suggested that resonance conditions with the plasmon extinction rather than with analyte absorption govern the Raman signal enhancement from silvered AAO substrates.

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