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Xiang-Bai Chen, Jun-Hwan Shin, Hyun-Tak Kim and Yong-Sik Lim Raman analyses of co-phasing and hysteresis behaviors in V2O3 thin film Journal of Raman Spectroscopy 43

Version of Record online: 12 JUL 2012 | DOI: 10.1002/jrs.4112

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We present the studies of the phase transition behaviors of V2O3 thin film using temperature-dependent Raman scattering spectroscopy. Our results show that in both the cooling and heating processes of V2O3 thin film, the phase transition occurs gradually but not suddenly, contrary to that in single crystal. The coexistence of both the metal and insulator phases with co-phasing ΔTc larger than 30 K is observed in both the cooling and heating processes. We discuss that this large co-phasing ΔTc should be distinguished with the large hysteresis ΔTh reported in nanostructures. In addition, our discussions indicate that co-phasing ΔTc and hysteresis ΔTh would be mainly correlated with stress and defect states in sample, respectively. Furthermore, we suggest that stress would induce phase transitions in V2O3, and the stress (pressure)-induced phase transitions would behave differently comparing with the temperature-induced transitions under normal pressure.

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