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Wenlei Yu, Meijie Han, Kai Jiang, Zhihua Duan, Yawei Li, Zhigao Hu and Junhao Chu Enhanced Fröhlich interaction of semiconductor cuprous oxide films determined by temperature-dependent Raman scattering and spectral transmittance Journal of Raman Spectroscopy 44

Version of Record online: 15 JUL 2012 | DOI: 10.1002/jrs.4145

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The temperature dependence of Raman spectra for the cuprous oxide film has been measured. The variations from phonon intensity ratios reveal obvious anomalies with the decreasing temperature, indicating the existence of strong electron–phonon coupling mediated by Fröhlich interaction below 200 K.

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