Enzo Cazzanelli, T. Caruso, M. Castriota, A. R. Marino, A. Politano, G. Chiarello, M. Giarola and G. Mariotto Spectroscopic characterization of graphene films grown on Pt(111) surface by chemical vapor deposition of ethylene Journal of Raman Spectroscopy 44
In-situ and ex-situ characterization techniques (low-energy electron diffraction, high-resolution electron energy loss spectroscopy, scanning electron microscopy and Raman micro-spectroscopy) here used indicate the prevalence of single-layer regions and the presence of two different orientations of the graphene sheets, tilted of 0° and 30°, with respect to the Pt(111) substrate. Both these domain orientations generate a comparable Raman signal. Data from micro-Raman sampling indicates a better film quality than in previous deposition experiments on the same metal substrate.
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