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Shankaran Sundarajoo, Emad L. Izake, William Olds, Biju Cletus, Esa Jaatinen and Peter M. Fredericks Non-invasive depth profiling by space and time-resolved Raman spectroscopy Journal of Raman Spectroscopy 44

Version of Record online: 22 MAY 2013 | DOI: 10.1002/jrs.4313

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Time-resolved Raman spectroscopy, spatially offset Raman spectroscopy and time-resolved spatially offset Raman spectroscopy are critically investigated for their selectivity toward the deep layers of a sample and their efficiency in the stand-off detection of explosive precursors hidden in highly fluorescing packaging.

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