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W. Merlijn van Spengen and Joan Belles Roca On the noise limit of stress and temperature measurements with micro-Raman spectroscopy Journal of Raman Spectroscopy 44

Version of Record online: 3 JUN 2013 | DOI: 10.1002/jrs.4314

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We report on the experimental and theoretical assessment of the noise limit of mechanical stress measurements with micro-Raman spectroscopy. By comparing the experimental results obtained to recent theoretical work, we show that the acquisition is limited by photon shot noise over most of the range and is limited by electronic detector noise at very low light conditions only.

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