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Shen Xu, Xiaoduan Tang, Yanan Yue and Xinwei Wang Sub-micron imaging of sub-surface nanocrystalline structure in silicon Journal of Raman Spectroscopy 44

Version of Record online: 23 AUG 2013 | DOI: 10.1002/jrs.4366

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Raman intensity of 521 cm−1 peak of silicon increases abnormally, by about 100%, when the size of crystalline silicon varies from 20 nm to 10 nm next to a cleaved edge of silicon wafer.

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