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R. H. Rickman and P. R. Dunstan Enhancement of lattice defect signatures in graphene and ultrathin graphite using tip-enhanced Raman spectroscopy Journal of Raman Spectroscopy 45

Version of Record online: 22 NOV 2013 | DOI: 10.1002/jrs.4416

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Using tip-enhanced Raman spectroscopy, this study observed preferential enhancement of the D band on multilayered graphene and graphite. Heightened defect sensitivity was demonstrated on graphene edges, folds, and overlapping regions.

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