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Kristian O. Sylvester-Hvid, Thomas Tromholt, Mikkel Jørgensen, Frederik C. Krebs, Michael Niggemann, Klaus Zimmermann and Andreas W. Liehr Non-destructive lateral mapping of the thickness of the photoactive layer in polymer-based solar cells Progress in Photovoltaics: Research and Applications 21

Version of Record online: 30 NOV 2011 | DOI: 10.1002/pip.1190

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An experimental method for non-destructive mapping the thickness of the photo-active layer in organic solar cells is presented and demonstrated. The underlying methodology required for an efficient and automated data processing leading the thickness maps is outlined. In three application examples, the thickness distribution is then studied for P3HT:PCBM spun at different speed on ITO-glass (A), on PEDOT:PSS coated ITO-glass (B), and for P3HT:PCBM slot-die coated on ITO-covered PET foil using a concentration gradient for P3HT:PCBM (C).

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