E-mail a Wiley Online Library Link

Kristian O. Sylvester-Hvid, Thomas Tromholt, Mikkel Jørgensen, Frederik C. Krebs, Michael Niggemann, Klaus Zimmermann and Andreas W. Liehr Non-destructive lateral mapping of the thickness of the photoactive layer in polymer-based solar cells Progress in Photovoltaics: Research and Applications 21

Article first published online: 30 NOV 2011 | DOI: 10.1002/pip.1190

Thumbnail image of graphical abstract

An experimental method for non-destructive mapping the thickness of the photo-active layer in organic solar cells is presented and demonstrated. The underlying methodology required for an efficient and automated data processing leading the thickness maps is outlined. In three application examples, the thickness distribution is then studied for P3HT:PCBM spun at different speed on ITO-glass (A), on PEDOT:PSS coated ITO-glass (B), and for P3HT:PCBM slot-die coated on ITO-covered PET foil using a concentration gradient for P3HT:PCBM (C).

Complete the form below and we will send an e-mail message containing a link to the selected article on your behalf

Required = Required Field