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Yael Augarten, Thorsten Trupke, Martha Lenio, Jan Bauer, Juergen W. Weber, Matthias Juhl, Martin Kasemann and Otwin Breitenstein Calculation of quantitative shunt values using photoluminescence imaging Progress in Photovoltaics: Research and Applications 21

Version of Record online: 27 MAR 2012 | DOI: 10.1002/pip.2180

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A proof of concept study for determining quantitative shunt values from contactless photoluminescence images is presented. Experimental results calculated from specifically prepared test structures show good agreement with known shunt resistance values. The effect of the front metallisation on the appearance and interpretation of shunts in photoluminescence images is investigated experimentally.

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