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Gianluca Coletti Sensitivity of state-of-the-art and high efficiency crystalline silicon solar cells to metal impurities Progress in Photovoltaics: Research and Applications 21

Version of Record online: 27 MAR 2012 | DOI: 10.1002/pip.2195

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For the first time, the sensitivity to impurities of the solar cell conversion efficiency is reported for a state-of-the-art (i.e., 18%) and advanced device architecture (i.e., 23%).

Both device structures are not assumed to work in low injection level. This is a fundamental difference with the past and required for modeling future high efficiency devices. In general, advanced devices will be more sensitive to the impurity content than the state-of-the-art cell design. The effect of the substrate thickness is also taken in consideration in the study.

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