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Maxim P. Nikiforov and Seth B. Darling Improved conductive atomic force microscopy measurements on organic photovoltaic materials via mitigation of contact area uncertainty Progress in Photovoltaics: Research and Applications 21

Version of Record online: 13 JUN 2012 | DOI: 10.1002/pip.2217

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New technique for AFM-based quantitative electrical measurements is developed.Performance of the technique is validated on device-relevant OPV material. Electrical properties and chemical composition of the active layer found to be inhomogeneous at hundred-nanometers and micrometer length scales.

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