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Dominic Walter, Philipp Rosenits, Bastian Berger, Stefan Reber and Wilhelm Warta Determination of the minority carrier lifetime in crystalline silicon thin-film material Progress in Photovoltaics: Research and Applications 22

Version of Record online: 26 JUN 2012 | DOI: 10.1002/pip.2242

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The effective carrier lifetime of crystalline silicon thin-film material has been measured on a wide range of different material qualities using two independent microwave-detected photoconductivity decay setups. No systematic deviation between the two measurement setups could be observed. Through a variation of the epitaxial layer thickness, the recombination in the interface region between the layer and the underlying substrate has been identified to be the limiting factor of the effective lifetimes.

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