A. Ortner, O. Gräff, M. Stelzl, F. Macherey and R. Neubecker ‘Edge-light’: combination of sensitive crack detection and luminescence measurements Progress in Photovoltaics: Research and Applications 21
Edge-light is a combination of a very sensitive crack detection principle with luminescence measurements, usable for silicon wafers and cells. It is realized in a single setup with only one camera. All images are generated in a single pass in continuous motion.
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