E-mail a Wiley Online Library Link

A. Ortner, O. Gräff, M. Stelzl, F. Macherey and R. Neubecker ‘Edge-light’: combination of sensitive crack detection and luminescence measurements Progress in Photovoltaics: Research and Applications 21

Version of Record online: 27 SEP 2012 | DOI: 10.1002/pip.2275

Thumbnail image of graphical abstract

Edge-light is a combination of a very sensitive crack detection principle with luminescence measurements, usable for silicon wafers and cells. It is realized in a single setup with only one camera. All images are generated in a single pass in continuous motion.

Complete the form below and we will send an e-mail message containing a link to the selected article on your behalf

Required = Required Field