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Sanekazu Igari and Kiyoshi Takahisa Accelerated irradiance and temperature cycle test for amorphous silicon photovoltaic devices Progress in Photovoltaics: Research and Applications 22

Version of Record online: 13 DEC 2012 | DOI: 10.1002/pip.2321

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We have developed an accelerated irradiance and temperature cycle test to evaluate the long-term performance stability of amorphous silicon photovoltaic devices. The results of the accelerated irradiance and temperature cycle test agreed well with the experimental results of outdoor exposure, and subsequent simulation of 30-year outdoor exposure revealed that the I–V parameter of cells would not undergo rapid degradation. Data obtained by the accelerated irradiance and temperature cycle test will be useful in improving the estimation accuracy of electrical energy generated from thin-film photovoltaic power systems.

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