E-mail a Wiley Online Library Link

Jack Flicker, Robert Kaplar, Benjamin Yang, Matthew Marinella and Jennifer Granata Insulated gate bipolar transistor reliability testing protocol for PV inverter applications Progress in Photovoltaics: Research and Applications 22

Version of Record online: 16 JAN 2013 | DOI: 10.1002/pip.2351

Thumbnail image of graphical abstract

To decrease cost of ownership of photovoltaic systems, less costly and more reliable photovoltaic inverters must be developed. Insulated gate bipolar transistors (IGBTs) are a significant cause of inverter failures and system inefficiencies, so a thorough understanding of their strengths and weaknesses with regards to inverters is necessary. This paper summarizes the current state of experimentation surrounding the use of IGBTs in photovoltaic inverters and discusses the construction, use, lifetime, and reliability of IGBTs regularly used in photovoltaic inverters.

Complete the form below and we will send an e-mail message containing a link to the selected article on your behalf

Required = Required Field