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Peter Hacke, Ryan Smith, Kent Terwilliger, Greg Perrin, Bill Sekulic and Sarah Kurtz Development of an IEC test for crystalline silicon modules to qualify their resistance to system voltage stress Progress in Photovoltaics: Research and Applications 22

Version of Record online: 23 NOV 2013 | DOI: 10.1002/pip.2434

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The damp heat environmental chamber tests run according to the IEC protocol under development distinguish the relative resistance of five module designs to potential-induced degradation in the field and correctly rank order the durability in the field to the extent tested, up to 28 months.

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