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G. Naresh-Kumar, B. Hourahine, A. Vilalta-Clemente, P. Ruterana, P. Gamarra, C. Lacam, M. Tordjman, M. A. di Forte-Poisson, P. J. Parbrook, A. P. Day, G. England and C. Trager-Cowan Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope physica status solidi (a) 209

Version of Record online: 25 JAN 2012 | DOI: 10.1002/pssa.201100416

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