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Janina Möreke, Milan Ťapajna, Michael J. Uren, Yi Pei, Umesh K. Mishra and Martin Kuball Effects of gate shaping and consequent process changes on AlGaN/GaN HEMT reliability physica status solidi (a) 209

Article first published online: 20 SEP 2012 | DOI: 10.1002/pssa.201228395

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