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K. Hinrichs, S. D. Silaghi, C. Cobet, N. Esser and D. R. T. Zahn Ellipsometry from infrared to vacuum ultraviolet: Structural properties of thin anisotropic guanine films on silicon physica status solidi (b) 242

Version of Record online: 6 OCT 2005 | DOI: 10.1002/pssb.200541154

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