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Markus Heyde, Georg H. Simon and Leonid Lichtenstein Resolving oxide surfaces – From point and line defects to complex network structures physica status solidi (b) 250

Article first published online: 11 APR 2013 | DOI: 10.1002/pssb.201248597

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The determination of structure has always been in the focus of the scientific community. Still, diffraction methods are powerful tools in the field of surface science. However, they have limitations when it comes to the analysis of complex structures or materials without periodicity and order. This topic is clearly visible in the Feature Article by Markus Heyde et al. Here, the authors present how they have applied state of the art atomic force and scanning tunneling microscopy to verify oxide film structures ranging from zero-dimensional (0D) point defects, one-dimensional (1D) line defects to two-dimensional (2D) random networks, i.e. amorphous structures. The latter example has fully demonstrated the validity of Zachariasen's postulation and thereby unraveled for the first time the real-space structure of an amorphous solid in all of its details.

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