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N. Burle, S. Escoubas, E. Kasper, J. Werner, M. Oehme and K. Lyutovich X-ray imaging and diffraction study of strain relaxation in MBE grown SiGe/Si layers physica status solidi (c) 10

Article first published online: 5 DEC 2012 | DOI: 10.1002/pssc.201200544

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