E-mail

E-mail a Wiley Online Library Link

Saptarshi Das and Joerg Appenzeller Screening and interlayer coupling in multilayer MoS2 physica status solidi (RRL) - Rapid Research Letters 7

Article first published online: 6 MAR 2013 | DOI: 10.1002/pssr.201307015

Thumbnail image of graphical abstract

The authors present the first comprehensive experimental study on the dependence of carrier mobility on the layer thickness of multilayer MoS2 field-effect transistors. They also propose a theoretical model based on Thomas–Fermi charge screening and interlayer coupling in order to explain their findings. Their model is extremely generic and can be applied to any two-dimensional layered system.

Complete the form below and we will send an e-mail message containing a link to the selected article on your behalf

Required = Required Field

Choose captcha format: Image or Audio. Click here if you need help.

SEARCH