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Jason P. Killgore, Roy H. Geiss and Donna C. Hurley Continuous Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy Small 7

Version of Record online: 15 MAR 2011 | DOI: 10.1002/smll.201002116

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Contact resonance force microscopy is used during AFM scanning to resolve instantaneous and progressive nanometer-scale changes in the contact radius between an AFM tip and a silicon substrate. High-resolution quantitative measurements of contact radius reveal real-time information on wear rate, fracture, and tip-symmetry.

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