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Eric R. Hemesath, Daniel K. Schreiber, Christian F. Kisielowski, Amanda K. Petford-Long and Lincoln J. Lauhon Atomic Structural Analysis of Nanowire Defects and Polytypes Enabled Through Cross-Sectional Lattice Imaging Small 8

Article first published online: 22 MAR 2012 | DOI: 10.1002/smll.201102404

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Definitive structure determination in nanocrystals using high-resolution transmission electron microscopy is complicated by the multiple factors that can contribute to forbidden reflections. Site-specific cross-sectional imaging of silicon nanowires is used to identify the many origins of forbidden reflections that manifest in plan-view images along low index zone axes, showing that finite size effects, stacking faults, and polytype structure can all contribute to structure in images.

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