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Benjamin P. Brown, Loren Picco, Mervyn J. Miles and Charl F. J. Faul Opportunities in High-Speed Atomic Force Microscopy Small 9

Version of Record online: 23 APR 2013 | DOI: 10.1002/smll.201203223

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Developments in instrumentation for “high-speed AFM” (HSAFM) have been ongoing since the 1990s, and now nanometer resolution imaging and lithography at video rate is readily achievable. This review provides a summary of different approaches to and advances in the development of high-speed AFMs, highlights important discoveries made with new instruments, and discusses new possibilities for HSAFM in materials science.

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