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Kenichi Hatasako, Fumitoshi Yamamoto, Akio Uenishi, Takashi Kuroi and Shigeto Maegawa Analysis of Snapback Phenomena in VDMOS Transistor having the High Second Breakdown Current: A High ESD Mechanism Analysis IEEJ Transactions on Electrical and Electronic Engineering 4

Article first published online: 26 OCT 2009 | DOI: 10.1002/tee.20470

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