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Cyril Cayron, Martien Den Hertog, Laurence Latu-Romain, Céline Mouchet, Christopher Secouard, Jean-Luc Rouviere, Emmanuelle Rouviere and Jean-Pierre Simonato Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins Journal of Applied Crystallography 42

Version of Record online: 9 APR 2009 | DOI: 10.1107/S0021889808042131

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