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Scott Classen, Greg L. Hura, James M. Holton, Robert P. Rambo, Ivan Rodic, Patrick J. McGuire, Kevin Dyer, Michal Hammel, George Meigs, Kenneth A. Frankel and John A. Tainer Implementation and performance of SIBYLS: a dual endstation small-angle X-ray scattering and macromolecular crystallography beamline at the Advanced Light Source Journal of Applied Crystallography 46

Version of Record online: 18 JAN 2013 | DOI: 10.1107/S0021889812048698

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