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M. Schoonheim-Klein, A. Muijtens, L. Habets, M. Manogue, C. Van der Vleuten, J. Hoogstraten and U. Van der Velden On the reliability of a dental OSCE, using SEM: effect of different days European Journal of Dental Education 12

Version of Record online: 9 JUL 2008 | DOI: 10.1111/j.1600-0579.2008.00507.x

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