Chapter

Chapter 5.2 X‐ray diffraction methods: polycrystalline

Mathematical, physical and chemical tables

First Online Edition (2006)

Part 5. Determination of lattice parameters

  1. W. Parrish1,
  2. A. J. C. Wilson2,
  3. J. I. Langford3

Published Online: 1 JAN 2006

DOI: 10.1107/97809553602060000596

International Tables for Crystallography

International Tables for Crystallography

How to Cite

Parrish, W., Wilson, A. J. C. and Langford, J. I. 2006. X‐ray diffraction methods: polycrystalline. International Tables for Crystallography. C:5:5.2:491–504.

Author Information

  1. 1

    IBM Almaden Research Center, San Jose, CA, USA

  2. 2

    St John’s College, Cambridge CB2 1TP, England

  3. 3

    School of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

Publication History

  1. Published Online: 1 JAN 2006

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Abstract

The determination of lattice parameters using X‐ray powder methods is reviewed. Topics covered include: wavelength errors, refraction and statistical fluctuations; geometrical and physical aberrations; angle‐dispersive diffractometer methods (using conventional and synchrotron sources); whole‐pattern methods; energy‐dispersive techniques; camera methods; testing for remanent systematic error; powder‐diffraction, intensity and instrumental line‐profile‐shape standards; and factors determining accuracy.

Keywords:

  • aberrations;
  • accuracy;
  • analytical extrapolation of lattice;
  • angle‐dispersive diffractometry;
  • Bragg angle;
  • camera methods;
  • detection;
  • diffractometry;
  • errors;
  • geometrical aberrations;
  • lattice‐parameter determination;
  • physical aberrations;
  • powder diffraction;
  • refraction;
  • remanent systematic errors;
  • standard reference materials;
  • standard specimens;
  • statistical fluctuations;
  • synchrotron radiation;
  • systematic errors;
  • wavelength problems;
  • X‐ray powder techniques