Chapter 5.3 X‐ray diffraction methods: single crystal

Mathematical, physical and chemical tables

First Online Edition (2006)

Part 5. Determination of lattice parameters

  1. E. Gałdecka

Published Online: 1 JAN 2006

DOI: 10.1107/97809553602060000597

International Tables for Crystallography

International Tables for Crystallography

How to Cite

Gałdecka, E. 2006. X‐ray diffraction methods: single crystal. International Tables for Crystallography. C:5:5.3:505–536.

Author Information

  1. Institute of Low Temperature and Structure Research, Polish Academy of Sciences, PO Box 937, 50‐950 Wrocław 2, Poland

Publication History

  1. Published Online: 1 JAN 2006



Lattice‐parameter determination using X‐ray diffraction methods on single crystals is reviewed. All the methods are classified with respect to the measurement technique, in particular into photographic and counter‐diffractometer techniques. The methods are described in approximately chronological sequence, i.e. from the earliest and simplest rotating‐crystal method to the latest non‐dispersive techniques, and at the same time from those of poor accuracy and precision to those attaining the highest precision and/or accuracy. In each of the methods realizing a given technique, first the absolute and then the relative method are described.


  • cameras;
  • divergent‐beam techniques;
  • Kossel method;
  • lattice‐parameter changes;
  • lattice‐parameter determination;
  • photographic methods;
  • single‐crystal X‐ray techniques;
  • single‐crystal methods;
  • systematic errors;
  • X‐ray beam