Chapter

Chapter 5.4 Electron‐diffraction methods

Mathematical, physical and chemical tables

First Online Edition (2006)

Part 5. Determination of lattice parameters

  1. A. W. S. Johnson1,
  2. A. Olsen2

Published Online: 1 JAN 2006

DOI: 10.1107/97809553602060000598

International Tables for Crystallography

International Tables for Crystallography

How to Cite

Johnson, A. W. S. and Olsen, A. 2006. Electron‐diffraction methods. International Tables for Crystallography. C:5:5.4:537–540.

Author Information

  1. 1

    Centre for Microscopy and Microanalysis, University of Western Australia, Nedlands, WA 6009, Australia

  2. 2

    Department of Physics, University of Oslo, PO Box 1048, N‐0316 Blindern, Norway

Publication History

  1. Published Online: 1 JAN 2006

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Abstract

Lattice‐parameter determination by electron‐diffraction methods is reviewed. Obtaining cell axes and angles from a single pattern with suitable Laue zones and two patterns with different zone axes is discussed. Methods based on Kikuchi or high‐order Laue zone (HOLZ) lines are also described: these have the advantage that the camera constant does not need to be known.

Keywords:

  • HOLZ;
  • high‐order Laue zone;
  • Kikuchi techniques;
  • lattice‐parameter determination