Chapter

Chapter 7.4 Correction of systematic errors

Mathematical, physical and chemical tables

First Online Edition (2006)

Part 7. Measurement of intensities

  1. N. G. Alexandropoulos1,
  2. M. J. Cooper2,
  3. P. Suortti3,
  4. B. T. M. Willis4

Published Online: 1 JAN 2006

DOI: 10.1107/97809553602060000607

International Tables for Crystallography

International Tables for Crystallography

How to Cite

Alexandropoulos, N. G., Cooper, M. J., Suortti, P. and Willis, B. T. M. 2006. Correction of systematic errors. International Tables for Crystallography. C:7:7.4:653–665.

Author Information

  1. 1

    Department of Physics, University of Ioannina, PO Box 1186, Gr‐45110 Ioannina, Greece

  2. 2

    Department of Physics, University of Warwick, Coventry CV4 7AL, England

  3. 3

    Department of Physics, PO Box 9, University of Helsinki, FIN‐00014 Helsinki, Finland

  4. 4

    Chemical Crystallography Laboratory, University of Oxford, 9 Parks Road, Oxford OX1 3PD, England

Publication History

  1. Published Online: 1 JAN 2006

SEARCH

Abstract

The theory of the thermal diffuse scattering correction, which is quite different for X‐rays and for neutrons, is described. The contribution of Compton scattering to Bragg intensities is explained and tables are presented for the incoherent scattering function for elements up to atomic number 55 and sin θ/λ values up to 2.0 Å−1. Different models for calculating the incoherent scattering are discussed. Background components of X‐ray scattering from a crystalline sample and from different inelastic components of the scattered radiation are described.

Keywords:

  • absorption;
  • background;
  • Compton scattering;
  • correction factor;
  • correction of systematic errors;
  • detection;
  • plasmons;
  • powder diffraction;
  • correction factor for powders;
  • Raman scattering;
  • resonant Raman scattering;
  • scattering;
  • systematic errors;
  • thermal diffuse scattering;
  • Thomas–Fermi method;
  • white radiation