Chapter

Chapter 8.8 Accurate structure‐factor determination with electron diffraction

Mathematical, physical and chemical tables

First Online Edition (2006)

Part 8. Refinement of structural parameters

  1. J. Gjønnes

Published Online: 1 JAN 2006

DOI: 10.1107/97809553602060000616

International Tables for Crystallography

International Tables for Crystallography

How to Cite

Gjønnes, J. 2006. Accurate structure‐factor determination with electron diffraction. International Tables for Crystallography. C:8:8.8:735–743.

Author Information

  1. Department of Physics, University of Oslo, PO Box 1048, Blindern, N‐0316 Oslo, Norway

Publication History

  1. Published Online: 1 JAN 2006

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Abstract

Techniques for accurate structure‐factor determination with electron diffraction are discussed. Topics covered include: the systematic row method; three‐ and four‐beam nonsystematic cases; zone‐axis convergent‐beam electron diffraction; the critical voltage and intersecting‐Kikuchi‐line method; phases and absorption in multiple‐beam cases; and thickness fringes.

Keywords:

  • Bethe approximation;
  • Bloch‐wave method;
  • convergent‐beam electron diffraction;
  • critical‐voltage effect;
  • Debye–Waller factors;
  • dispersion surfaces;
  • electron diffraction;
  • extinction distance;
  • Fourier potentials;
  • Intersecting‐Kikuchi‐line method;
  • Kikuchi patterns;
  • Kossel patterns;
  • Schrödinger wave equation;
  • structure factors;
  • Thickness fringes