Surface and Interface Analysis

Cover image for Vol. 44 Issue 3

Impact Factor: 1.249

ISI Journal Citation Reports © Ranking: 2010: 89/127 (Chemistry Physical)

Online ISSN: 1096-9918

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  1. Combined XPS and first principle study of metastable Mg–Ti thin films

    I. J. T. Jensen, O. M. Løvvik, H. Schreuders, B. Dam and S. Diplas

    Article first published online: 7 FEB 2012 | DOI: 10.1002/sia.4847

  2. Synchrotron investigation of the multilayer nanoperiodical Al2O3/SiO/Al2O3/SiO…Si structure formation

    S. Yu. Turishchev, V. A. Terekhov, D. A. Koyuda, K. N. Pankov, E. P. Domashevskaya, A. V. Ershov, I. A. Chugrov and A. I. Mashin

    Article first published online: 7 FEB 2012 | DOI: 10.1002/sia.4868

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