X-Ray Spectrometry

Cover image for Vol. 43 Issue 3

Impact Factor: 1.546

ISI Journal Citation Reports © Ranking: 2012: 24/43 (Spectroscopy)

Online ISSN: 1097-4539

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2013 Best Referee Award

 Ursula Fittschen (Germany) Izumi Nakai (Japan)

X-Ray Spectrometry is pleased to announce that the 2013 Best Referee Award has been presented to Ursula Fittschen (Germany) and Izumi Nakai (Japan). Congratulations to the two awardees and thank you to all the other anonymous referees for all the hard and important review work for X-Ray Spectrometry.
The 2013 awards were handed out in a brief ceremony during the TXRF Conference, on 26 September 2013 in Osaka, Japan.

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John Campbell

Introducing John Campbell, the new regional editor for North America of X-Ray Spectrometry.
Now Emeritus Professor in Physics at the University of Guelph in Canada and currently working as co-investigator on NASA's Mars Science Laboratory mission, John L. (Iain) Campbell’s work and expertise fit perfectly within the scope and aims of X-Ray Spectrometry.
We thank Prof. Campbell for his willingness to accept the task at hand, and also thank George Havrilla, for having done the job for the past 8 years.

Manuscripts for John Campbell, or other regional editors, can be submitted here.

Read the full article here.

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