© WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor-in-Chief: Peter Gregory, Deputy Editors: Mary Farrell, Duoduo Liang, Lorna Stimson
Online ISSN: 1521-4095
Associated Title(s): Advanced Electronic Materials, Advanced Energy Materials, Advanced Engineering Materials, Advanced Functional Materials, Advanced Healthcare Materials, Advanced Materials Interfaces, Advanced Optical Materials, Advanced Science, Particle & Particle Systems Characterization, Small
Cover Picture: Microscopic Evidence for Spatially Inhomogeneous Charge Trapping in Pentacene (Adv. Mater. 11/2005)
Trapped charge has been observed in polycrystalline pentacene films by electric force microscopy in work reported by Muller and Marohn on p. 1410. The cover shows an optical fiber watching the motion of a metal-coated cantilever hovering over a polycrystalline pentacene film. The film occupies the 6.5 &mgr;m gap in a working field-effect transistor. Trapped charge (dark blue and black areas in the pentacene) appears as large patches randomly distributed throughout the device, implying that long-lived traps in polycrystalline pentacene are not correlated with grain boundaries.