Advanced Materials

Cover image for Vol. 28 Issue 28

21_01b/2009Scanning Probe Microscopy: Electrical Scanning Probe Microscopy on Active Organic Electronic Devices (Adv. Mater. 1/2009)

The inside cover, drawn by Irene Wang, illustrates that electrical atomic force microscopy techniques can play an integral part in the research and development of organic electronic materials. On p. 19 Pingree, Reid, and Ginger highlight the use of scanning probe microscopy techniques in examining heterogeneities, defects, and various transport properties including injection, trapping, and generation/recombination in organic lightemitting diodes, thin-film transistors, and solar cells.

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