© WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor-in-Chief: Peter Gregory, Deputy Editors: Mary Farrell, Duoduo Liang, Lorna Stimson
Online ISSN: 1521-4095
Associated Title(s): Advanced Electronic Materials, Advanced Energy Materials, Advanced Engineering Materials, Advanced Functional Materials, Advanced Healthcare Materials, Advanced Materials Interfaces, Advanced Optical Materials, Advanced Science, Particle & Particle Systems Characterization, Small
Scanning Probe Microscopy: Electrical Scanning Probe Microscopy on Active Organic Electronic Devices (Adv. Mater. 1/2009)
The inside cover, drawn by Irene Wang, illustrates that electrical atomic force microscopy techniques can play an integral part in the research and development of organic electronic materials. On p. 19 Pingree, Reid, and Ginger highlight the use of scanning probe microscopy techniques in examining heterogeneities, defects, and various transport properties including injection, trapping, and generation/recombination in organic lightemitting diodes, thin-film transistors, and solar cells.