Advanced Materials

Cover image for Vol. 29 Issue 3

21_06/2009Nanoscale Conducting Oxide Writing: Nanoscale Writing of Transparent Conducting Oxide Features with a Focused Ion Beam (Adv. Mater. 6/2009)

A conductive atomic force microscopy tip probes an embedded, optically transparent, electrically conducting oxide nanowire that was patterned on an indium oxide substrate using focused ion beam implantation. The nanowire is 160 nm wide, 7 nm deep, and theoretically limitless in length, connectivity, and shape. Nanowires of this type have potential application as interconnects in transparent electronics. Further details can be found in the article by Tobin Marks, Mark Hersam and co-workers on p.721.

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