Copyright © 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Editor-in-Chief: Peter Gregory, Deputy Editors: Martin Ottmar, Carolina Novo da Silva, Lorna Stimson
Online ISSN: 1521-4095
Associated Title(s): Advanced Energy Materials, Advanced Engineering Materials, Advanced Functional Materials, Advanced Healthcare Materials, Advanced Materials Interfaces, Advanced Optical Materials, Particle & Particle Systems Characterization, Small
Silicon Pillars: Ultrahigh-Crystalline-Quality Silicon Pillars Formed by Millimeter-Wave Annealing of Amorphous Silicon on Glass (Adv. Mater. 29/2009)
Unique, three-dimensional structures—silicon pillars—are formed by millisecond long, single-pulse annealing of 110-GHz millimeter-wave radiation incident upon intrinsic amorphous silicon (a-Si) thin films deposited on glass by hot-wire chemical vapor deposition (HWCVD), as demonstrated by Fude Liu and co-workers on p. 3002. The cover shows a field-emission secondary-electron microscopy (FE-SEM) image of silicon pillars taken at a sample tilt angle of 52°.